US Patent Issued to Yale University on Dec. 16 for "CT-free attenuation correction for SPECT using deep learning with imaging and non-imaging information" (Connecticut Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,596, issued on Dec. 16, was assigned to Yale University (New Haven, Conn.).

"CT-free attenuation correction for SPECT using deep learning with imaging and non-imaging information" was invented by Chi Liu (Orange, Conn.), Bo Zhou (New Haven, Conn.) and Xiongchao Chen (New Haven, Conn.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A system based upon artificial neural networks generates attenuation-corrected SPECT from non-attenuation-corrected SPECT (single photon emission computed tomography) without or with an intermediate step of attenuation map estimation. The system includes a SPECT scanner with CZT cameras for dynamic SPECT imaging. The system...