ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,541,941, issued on Feb. 3, was assigned to Y Soft Corporation A.S. (Brno, Czech Republic).
"Method for testing an embedded system of a device, a method for identifying a state of the device and a system for these methods" was invented by Vaclav Novotny (Brno, Czech Republic), Ales Pernikar (Brno, Czech Republic), Barbora Perinova (Brno, Czech Republic), Jiri Kyzlink (Brno, Czech Republic), Jakub Pavlak (Brno, Czech Republic) and Ondrej Krajicek (Brno, Czech Republic).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of testing an embedded system of the device using a testing robot, a central control unit and a device under test. The device under tes...