US Patent Issued to Xtrava on Jan. 28 for "Methods to register and interpret lateral flow test strip assay measurements by transmission of multi-wavelength visible and near-visible light" (California Inventors)

ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,210,015, issued on Jan. 28, was assigned to Xtrava Inc. (Santa Clara, Calif.).

"Methods to register and interpret lateral flow test strip assay measurements by transmission of multi-wavelength visible and near-visible light" was invented by Sameh Sarhan (Santa Clara, Calif.) and Lawrence Herbert Zuckerman (Livermore, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method, apparatus and system that illuminates one face of a lateral flow assay test strip or test strip assembly with light of selected wavelengths and intensities and measures the resulting light intensities at the opposite face at the test stain line region and adjacent regions, in o...