ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,451,977, issued on Oct. 21, was assigned to Xilinx Inc. (San Jose, Calif.).
"Transceiver loopback testing" was invented by Rambabu Nerukonda (San Jose, Calif.), Weiqi Ding (San Jose, Calif.), Amitava Majumdar (San Jose, Calif.) and Bhuvanachandran K. Nair (San Jose, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A transceiver circuit is disclosed, the transceiver circuit including a first register circuit, configured to receive serial stimulus data and to generate multi-bit parallel stimulus data, a serializer circuit configured to receive the multi-bit parallel stimulus data and to generate serialized data based on the multi-bit parallel stimulu...