US Patent Issued to XILINX on Dec. 2 for "Equipment design and testing using in-situ on-die time-domain reflectometry" (California Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,487,268, issued on Dec. 2, was assigned to XILINX INC. (San Jose, Calif.).

"Equipment design and testing using in-situ on-die time-domain reflectometry" was invented by Zhaoyin Daniel Wu (Los Gatos, Calif.), Tianyu Fang (San Jose, Calif.), Chuen-Huei Chou (San Jose, Calif.), Christopher J. Borrelli (Los Gatos, Calif.) and Geoffrey Zhang (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Using "in-situ on-die time-domain reflectometry (TDR)" with data signal paths of integrated circuits, printed circuit boards, and data processing equipment and systems allows testing, verification and troubleshooting of data channel signal path impedance var...