US Patent Issued to Xidian University on Feb. 10 for "Pathological section analyzer with large field of view, high throughput and high resolution" (Chinese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,548,115, issued on Feb. 10, was assigned to Xidian University (Xi'an, China).

"Pathological section analyzer with large field of view, high throughput and high resolution" was invented by Xueli Chen (Xi'an, China), Huan Kang (Xi'an, China), Hui Xie (Xi'an, China), Duofang Chen (Xi'an, China), Shenghan Ren (Xi'an, China) and Wangting Zhou (Xi'an, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A large-field-of-view, high-throughput and high-resolution pathological section analyzer includes an image collector for collecting a set of computing microscopic images of a pathological section sample; a data preprocessing circuit for iteratively updating th...