US Patent Issued to XI'AN UNIIC SEMICONDUCTORS on Jan. 13 for "Delay calibration circuit, memory, and clock signal calibration method" (Chinese Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,277, issued on Jan. 13, was assigned to XI'AN UNIIC SEMICONDUCTORS Co. LTD. (Xi'an, China).

"Delay calibration circuit, memory, and clock signal calibration method" was invented by Xuerong Jia (Xi'an, China) and Song Wang (Xi'an, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A delay calibration circuit, a memory, and a clock signal calibration method are provided. The delay calibration circuit includes: a divided clock generation circuit, configured to receive an input external clock signal and output at least two channels of divided clock signals based on the external clock signal; a calibration circuit, connected to the divided clock genera...