US Patent Issued to XI'AN TECHNOLOGICAL UNIVERSITY on Sept. 30 for "Involute gear profile artifact for large gear traceable metrology" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,323, issued on Sept. 30, was assigned to XI'AN TECHNOLOGICAL UNIVERSITY (Xi'an, China).

"Involute gear profile artifact for large gear traceable metrology" was invented by Jialin Zhang (Xi'an, China), Jianhua Wang (Xi'an, China), Peili Yin (Xi'an, China), Shaokang Li (Xi'an, China), Bingqing Jiang (Xi'an, China), Zhen Xu (Xi'an, China), Yadong Zhang (Xi'an, China), Yunbo Shen (Xi'an, China), Dongfeng He (Xi'an, China), Xiaoli Wang (Xi'an, China), Xiaodong Chen (Xi'an, China) and Qiang Zhu (Xi'an, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An involute gear profile artifact for large gear traceable metrology includes six surfaces, including...