US Patent Issued to XI'AN MICROELECTRONICS TECHNOLOGY INSTITUTE on June 17 for "Methods and devices for detecting surface defects based on perceptual autoencoders" (Chinese Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,704, issued on June 17, was assigned to XI'AN MICROELECTRONICS TECHNOLOGY INSTITUTE (Xi'an, China).

"Methods and devices for detecting surface defects based on perceptual autoencoders" was invented by Shuaibing Guo (Xi'an, China), Yulong Hu (Xi'an, China) and Bo Chai (Xi'an, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a surface defect based on a perceptual autoencoder is provided, which belongs to the field of integrated circuit defect detection. By using perceptual loss instead of pixel-by-pixel loss, the problem of blurred single-pixel-loss output image with serious distortion at the edges is solved. This manner is ...