US Patent Issued to XI'AN JIAOTONG UNIVERSITY on Nov. 18 for "Two-point sampling optimization method and system for sinusoidal excitation-based frequency response measurement" (Chinese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,476,779, issued on Nov. 18, was assigned to XI'AN JIAOTONG UNIVERSITY (Xi'an, China).

"Two-point sampling optimization method and system for sinusoidal excitation-based frequency response measurement" was invented by Zipeng Liu (Xi'an, China) and Jinjun Liu (Xi'an, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure discloses a two-point sampling optimized method and system for sinusoidal excitation-based frequency response measurement. A plurality of points are sampled at equal intervals within the starting frequency and ending frequency range as initial information, the interpolation error of each sub-frequency band is estimate...