US Patent Issued to X Development on Dec. 30 for "Meta-learning for detecting object anomaly from images" (California, Washington, Nebraska Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,511,730, issued on Dec. 30, was assigned to X Development LLC (Mountain View, Calif.).

"Meta-learning for detecting object anomaly from images" was invented by Ananya Gupta (San Francisco), Phillip Ellsworth Stahlfeld (Mountain View, Calif.), Kshitij Naresh Nikhal (Lincoln, Neb.), Om Prakash Ravi (Sammamish, Wash.), Aviva Cheryl Shwaid (Santa Monica, Calif.), Arthur Robert Pope (Palo Alto, Calif.) and Xinyue Li (San Mateo, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, computer systems, and apparatus, including computer programs encoded on computer storage media, for training a classification neural network. The system generates, from a ...