US Patent Issued to X Development on Dec. 2 for "Hierarchical context in risk assessment using machine learning" (California, New Jersey, North Carolina Inventors)

ALEXANDRIA, Va., Dec. 2 -- United States Patent no. 12,488,576, issued on Dec. 2, was assigned to X Development LLC (Mountain View, Calif.).

"Hierarchical context in risk assessment using machine learning" was invented by Xin Li (Santa Clara, Calif.), Akshina Gupta (Warren, N.J.), Nishanth Singaraju (Waxhaw, N.C.), Eliot Julien Cowan (Atherton, Calif.) and Avery Noam Cowan (Atherton, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and apparatus for receiving a request for a risk assessment for a parcel, receiving a set of images for the parcel, the set of images including two or more images, each image having an image scale and an image resolution that is different from other images i...