ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,499,176, issued on Dec. 16, was assigned to X Development LLC (Mountain View, Calif.).
"High throughput characterization of aggregate particles" was invented by Ray Anthony Nagatani Jr. (San Francisco), Allen Richard Zhao (Mountain View, Calif.), Antonio Raymond Papania-Davis (Oakland, Calif.), Weishi Yan (Oakland, Calif.), Jeffrey Bush (Los Altos, Calif.), Charles Stephen Spirakis (Mountain View, Calif.) and Brian Howell (Berkeley, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Methods, systems, and apparatus, including computer programs encoded on computer storage media, for characterization of aggregate particles. A method includes obtaining, ...