US Patent Issued to Wuhan University on Sept. 30 for "Slm printing defect detection and repair method and system based on deep learning network" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,746, issued on Sept. 30, was assigned to Wuhan University (Wuhan, China).

"Slm printing defect detection and repair method and system based on deep learning network" was invented by Fang Dong (Wuhan, China), Zihan Yang (Wuhan, China), Xiangyu Lu (Wuhan, China), Junlai Zhao (Wuhan, China), Guoqing Zhang (Wuhan, China) and Yongzhen Jia (Wuhan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention discloses to a selective-laser-melting (SLM) printing defect detection and repair method and system based on a deep learning network and belongs to the technical field of additive manufacturing. The method includes: training a first neur...