US Patent Issued to WUHAN UNIVERSITY on April 22 for "Method and system for 3D contour reconstruction of AM parts based on light field imaging" (Chinese Inventors)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,283,065, issued on April 22, was assigned to WUHAN UNIVERSITY (Hubei, China).

"Method and system for 3D contour reconstruction of AM parts based on light field imaging" was invented by Hui Li (Hubei, China), Xiuhua Li (Hubei, China) and Shengnan Shen (Hubei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for 3D contour reconstruction of AM parts based on light field imaging, belonging to the field of image reconstruction technology is provided. The method includes constructing an EPI-UNet framework, where a preset light field dataset is used to construct a training set, learning labels from the disparity maps corresponding to th...