US Patent Issued to Wuhan Tianma Micro-Electronics on Dec. 9 for "Gamma debugging method and device, display panel and driving method, and display device" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 9 -- United States Patent no. 12,494,149, issued on Dec. 9, was assigned to Wuhan Tianma Micro-Electronics Co. Ltd. (Wuhan, China).

"Gamma debugging method and device, display panel and driving method, and display device" was invented by Li Qian (Wuhan, China) and Panpan Li (Wuhan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A Gamma debugging method includes: under a standard temperature condition, testing N reference samples to obtain standard Gamma data of the N reference samples with respect to a target Gamma curve; under test temperature conditions, testing the N reference samples to obtain reference Gamma data of the N reference samples; determining Gamma adjustment amount...