US Patent Issued to Wuhan Institute of Technology on Aug. 19 for "Defect detection method and device based on nonlinear system identification" (Chinese Inventors)

ALEXANDRIA, Va., Aug. 20 -- United States Patent no. 12,392,699, issued on Aug. 19, was assigned to Wuhan Institute of Technology (Wuhan, China).

"Defect detection method and device based on nonlinear system identification" was invented by Hanxin Chen (Wuhan, China), Shaoyi Li (Wuhan, China), Wenrui Yang (Wuhan, China) and Kai Tan (Wuhan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A defect detection method and device based on nonlinear system identification are provided. The defect detection method includes: performing, by a modal force hammer, hammer excitation on a test specimen according to a test schedule to generate an excitation signal and a response signal; acquiring, by a laser vibrometer, ...