US Patent Issued to WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY on May 27 for "Detection method of crease degree of screen and visual detection apparatus" (Chinese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,567, issued on May 27, was assigned to WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY Co. LTD. (Wuhan, China).

"Detection method of crease degree of screen and visual detection apparatus" was invented by Yali Liu (Hubei, China) and Yongzhen Jia (Hubei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present application provides a detection method of a crease degree of a screen and a visual detection device, the detection method includes: providing detection rays, and obliquely irradiating the detection rays onto a surface to be measured of the screen; acquiring detection rays reflected by the surface to be measured of the...