ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,380,223, issued on Aug. 5, was assigned to Wiz Inc. (New York).
"Techniques for risk and constraint-based inspection" was invented by Ami Luttwak (Binyamina, Israel), Yaniv Shaked (Tel Aviv, Israel), Shahar Rand (Haifa, Israel), Eric Abramov (Holon, Israel), Elad Gabay (Tel Aviv, Israel) and Yinon Costica (Tel Aviv, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for risk and constraint-based cybersecurity inspection of a computing environment is presented. The method includes querying an application programming interface (API) of a computing environment to detect a plurality of workloads deployed therein; determining a constrai...