US Patent Issued to WINDBOND ELECTRONICS on Aug. 12 for "Stress testing circuit and semiconductor memory device" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,385,968, issued on Aug. 12, was assigned to WINDBOND ELECTRONICS CORP. (Taichung, Taiwan).

"Stress testing circuit and semiconductor memory device" was invented by Nobuhiro Odaira (Yokohama, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present invention provides a stress testing circuit including a control circuit. In a test mode, the control circuit controls a supply voltage which is applied to a pre-charge circuit including transistors in a semiconductor memory device. The control circuit controls the supply voltage according to the voltage of an external power supply and the threshold voltage of the transistors included in the pre-charge ...