US Patent Issued to Winbond Electronics on Nov. 18 for "Test device and testing method for memory device" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,405, issued on Nov. 18, was assigned to Winbond Electronics Corp. (Taichung, Taiwan).

"Test device and testing method for memory device" was invented by Ying-Shan Kuo (Hsin Chu County, Taiwan), Lih-Wei Lin (Hsinchu, Taiwan) and You Cyun Su (Hsin Chu County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A test device and a testing method for a memory are provided. The test device includes a selection signal generator and a plurality of test pattern generators. The selection signal generator receives a test signal via a signal input end and detects a voltage variation on the test signal to generate a test mode selection signal. The test patter...