ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,300, issued on June 17, was assigned to Winbond Electronics Corp. (Taichung, Taiwan).
"Testing device and testing method thereof" was invented by Kuan-Cheng Chang (Taichung, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A testing device and a testing method thereof. The testing device includes a controller and a data storage device. The controller receives multiple command sequences respectively sent by application platforms through an input interface. The data storage device stores multiple circuit information corresponding to each of the application platforms and each of the command sequences corresponding to each of the application platfo...