ALEXANDRIA, Va., June 6 -- United States Patent no. 12,283,334, issued on April 22, was assigned to Winbond Electronics Corp. (Taichung, Taiwan).
"Method and apparatus for memory testing" was invented by Shih-Hung Chen (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are a method and an apparatus for memory testing. The method comprises following steps: using a test program group including N test programs to test M dies respectively to generate independent N test data, wherein N and M are positive integers greater than 1; and executing a neural network operation on the N test data to estimate a yield of M dies passing the test program group."
The patent was filed on Aug. 8, 2023, un...