ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,504,385, issued on Dec. 23, was assigned to Wickon Hightech GmbH (Landau, Germany).
"Inspection system and method for analyzing faults" was invented by Roman Wieser (Landau / Isar, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "The invention relates to an inspection system (26) for analyzing defects in a product, the inspection system (26) comprising a projection device (32), an optical detection device (28) and a processing device, the projection device having a spectrometer member configured to split white light into its spectral components and project a multichromatic light beam (37) formed from monochromatic light beams onto a product, a det...