US Patent Issued to Wenzhou University on Sept. 16 for "Voltage mode weak-PUF circuit with rich challenge-response pairs" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,417,321, issued on Sept. 16, was assigned to Wenzhou University (Zhejiang, China).

"Voltage mode weak-PUF circuit with rich challenge-response pairs" was invented by Gang Li (Zhejiang, China), Pengjun Wang (Zhejiang, China), Hui Li (Zhejiang, China) and Ziyu Zhou (Zhejiang, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A voltage mode weak-PUF circuit with rich challenge-response pairs comprises four decoders, two PUF arrays, a sequential control circuit and a voltage comparator. One-to-two PUF arrays are used to replace existing one-to-one PUF arrays to increase the number of challenge-response pairs by 2N times, from 2N realized by the one-to-o...