US Patent Issued to WENZHOU UNIVERSITY on April 15 for "Vacuum-helium-leak-detection method based on carbon-nanotube-based field-emission sensor" (Chinese Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,276,576, issued on April 15, was assigned to WENZHOU UNIVERSITY (Zhejiang, China).

"Vacuum-helium-leak-detection method based on carbon-nanotube-based field-emission sensor" was invented by Changkun Dong (Wenzhou, China), Ruizi Liu (Wenzhou, China) and Jie Wang (Wenzhou, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A vacuum-helium-leak-detection method based on a carbon-nanotube-based field-emission sensor that includes a carbon-nanotube-based cathode having a Raman amorphous peak ID/graphite peak IG ratio greater than 1.0. The method involves: setting a field-emission current at an initial, small emission current, recording an average of values ...