US Patent Issued to Washington University on March 25 for "Motion free CT sampling with electron beam scanning and time delay integration detector" (Missouri Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,257,084, issued on March 25, was assigned to Washington University (St. Louis).

"Motion free CT sampling with electron beam scanning and time delay integration detector" was invented by Tiezhi Zhang (St. Louis), Qinghao Chen (St. Louis), Shuang Zhou (St. Louis) and Yuewen Tan (St. Louis).

According to the abstract* released by the U.S. Patent & Trademark Office: "A CT scanning method compensates gantry motion blurring in projection measurement based on synchronized focal spot movement and detector data shifting. Tube power is increased by moving the focal on the target and reducing focal spot dwell duration. The CT scanning method is used on helical CT and cone beam with a rotating ...