ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,995, issued on Jan. 20, was assigned to VueReal Inc. (Waterloo, Canada).
"Method of testing a microdevice in integrated systems" was invented by Gholamreza Chaji (Kitchener, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "What is disclosed are structures and methods for testing and repairing emissive display systems. Systems are tested with use of temporary electrodes which allow operation of the system during testing and are removed afterward. Systems are repaired after identification of defective devices with use of redundant switching from defective devices to functional devices provided on repair contact pads."
The patent was filed on May...