ALEXANDRIA, Va., June 5 -- United States Patent no. 12,276,679, issued on April 15, was assigned to VueReal Inc. (Waterloo, Canada).
"Coupling probe for micro device inspection" was invented by Gholamreza Chaji (Waterloo, Canada) and Won Kyu Ha (Waterloo, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure describes a probe design to measure cycles of microdevices. In particular, the probe comprises, electrodes, dielectric, stimulating capacitor, voltage stimulating source for time varying stimulating voltage signal and a series switch to control biasing condition. The probe structure further has a probe tip and resting pads (ring shape or otherwise) along with a leveling mechanism a...