US Patent Issued to VIANAI SYSTEMS on Feb. 10 for "Visually creating and monitoring machine learning models" (California, Massachusetts Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,924, issued on Feb. 10, was assigned to VIANAI SYSTEMS INC. (Palo Alto, Calif.).

"Visually creating and monitoring machine learning models" was invented by Vishal Inder Sikka (Los Altos Hills, Calif.), Daniel James Amelang (San Diego) and Kevin Frederick Dunnell (Waltham, Mass.).

According to the abstract* released by the U.S. Patent & Trademark Office: "One embodiment of the present invention sets forth a technique for creating a machine learning model. The technique includes generating a user interface comprising one or more components for visually generating the machine learning model. The technique also includes modifying source code specifying a plurality of mathematical exp...