US Patent Issued to VIA LABS on Dec. 16 for "Integrated circuit, testing system, and operating method thereof" (Taiwanese Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,415, issued on Dec. 16, was assigned to VIA LABS INC. (New Taipei, Taiwan).

"Integrated circuit, testing system, and operating method thereof" was invented by Yi-Te Chen (New Taipei, Taiwan), Cheng Jun Yeh (New Taipei, Taiwan) and Hsiao-Chyi Lin (New Taipei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit (IC), a testing system, and an operating method are provided. The IC includes a receiver circuit and a processing circuit. The receiver circuit processes a communication signal based on a setting threshold voltage and multiple current operating parameters. The processing circuit obtains at least one current parameter amo...