US Patent Issued to Ventana Medical Systems on Oct. 21 for "Histological stain pattern and artifacts classification using few-shot learning" (Arizona Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,450,927, issued on Oct. 21, was assigned to Ventana Medical Systems Inc. (Tucson, Ariz.).

"Histological stain pattern and artifacts classification using few-shot learning" was invented by Christian Roessler (Tucson, Ariz.), Yao Nie (Tuscon, Ariz.), Nazim Shaikh (Tucson, Ariz.) and Daniel Bauer (Tucson, Ariz.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for classifying field of view (FOV) images of histological slides into various categories that include certain stain patterns, artifacts, and/or other features of interest are provided herein. Few-shot learning (e.g., a prototypical network) techniques are used to train a deep convol...