ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,326, issued on Dec. 16, was assigned to Velocity Image Processing LLC (Tiverton, R.I.).

"Auto focus system for inspection of high-density parts" was invented by Robert P. Bishop (Tiverton, R.I.) and Timothy Pinkney (Naples, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and apparatus to maintain image focus on parts such as wafers, circuit boards, or high-density substrates as the part is being inspected. Focus performance is independent of feature and trace orientation and density. This apparatus can be easily integrated into an inspection system and can maintain focus on parts with high aspect ratio structures and or low or non-refle...