US Patent Issued to vdW Design on Oct. 28 for "High-performance probe for near-field antenna measurement" (Wisconsin Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,457,012, issued on Oct. 28, was assigned to vdW Design LLC (Madison, Wis.).

"High-performance probe for near-field antenna measurement" was invented by Daniel W. van der Weide (Madison, Wis.) and Mohammadreza Ranjbar Naeini (Madison, Wis.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided herein are high-performance, compact probes for use in near-field antenna measurement, such as over-the-air antenna measurements. In particular, the probes herein simplify detection by mixing the near-field radio frequency (RF) signal with a local oscillator (LO) right at the probe plane."

The patent was filed on Aug. 2, 2023, under Application No. 18/364,328.

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