US Patent Issued to VAREX IMAGING on Sept. 30 for "Imaging system with wide x-ray beam and circumferentially arranged detection mechanism" (American, Swiss Inventors)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,426,843, issued on Sept. 30, was assigned to VAREX IMAGING Corp. (Salt Lake City).

"Imaging system with wide x-ray beam and circumferentially arranged detection mechanism" was invented by Michael Stamm (Schaffhausen, Switzerland), David T. Nisius (Des Plaines, Ill.), Daniel Shedlock (Knoxville, Tenn.), Josh M. Star-Lack (Palo Alto, Calif.), Gregory C. Andrews (West Jordan, Utah) and Matthias Ehrat (Hettlingen, Switzerland).

According to the abstract* released by the U.S. Patent & Trademark Office: "An imaging system for inspecting multiple objects includes an x-ray source having a beam width greater than or equal to a threshold beam size. The multiple objects is irradiated by the x-...