ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,384, issued on Oct. 21, was assigned to Varex Imaging Corp. (Salt Lake City).
"Inspection system" was invented by Rajashekar Venkatachalam (Cypress, Texas), David T Nisius (Des Plaines, Ill.), Clyde May (Gulf Breeze, Fla.) and John Iman (Houston).
According to the abstract* released by the U.S. Patent & Trademark Office: "Some embodiments include an inspection system, comprising: a radiation source; a radiation detector including an imaging array; a support structure configured to maintain a spatial relationship between the radiation source and the radiation detector; a motion control system configured to move an object relative to the radiation detector; control logic configured...