ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,255, issued on Dec. 16, was assigned to Varex Imaging Nederland B.V. (Doetinchem, Netherlands).
"X-ray beam control apparatus" was invented by Perry Brouwer (Huissen, Netherlands), Frans Monchen (Doetinchem, Netherlands) and Bart Overkamp (Aalten, Netherlands).
According to the abstract* released by the U.S. Patent & Trademark Office: "An x-ray beam control apparatus including at least one moveable x-ray attenuating member, and at least one position sensor, wherein the position sensor is configured to contactlessly detect movement of at least one of the attenuating members and to output a signal indicative of the position of the attenuating member."
The patent was filed on Aug. ...