ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,395, issued on Sept. 23, was assigned to UNIVERSITY OF WINDSOR (Windsor, Canada).
"Capacitance variation measurement mixed signal IC based on high-frequency response" was invented by Mitra Mirhassani (LaSalle, Canada) and Hamidreza Esmaeili Taheri (Markham, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "In a preferred embodiment, there is provided a method for measuring a capacitance change or difference of a sensing capacitor, the method comprising: sweeping a frequency range of first and second alternating current (AC) voltage sources respectively connected to first and second amplifiers, said first amplifier having or connected to a first...