US Patent Issued to University of Virginia Patent Foundation on Nov. 18 for "System and method for integrating diode sensors on micromachined wafer probes" (Virginia Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,377, issued on Nov. 18, was assigned to University of Virginia Patent Foundation (Charlottesville, Va.).

"System and method for integrating diode sensors on micromachined wafer probes" was invented by Robert M. Weikle II (Crozet, Va.), Linli Xie (Charlottesville, Va.), Michael E. Cyberey (Charlottesville, Va.), Souheil Nadri (Charlottesville, Va.), Matthew F. Bauwens (Chesapeake, Va.), Arthur Weston Lichtenberger (Charlottesville, Va.) and Nicolas Scott Barker (Charlottesville, Va.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A probe chip device and a method for fabricating a probe chip device with an integrated diode sensor are disclosed. In one ...