US Patent Issued to UNIVERSITY OF SOUTH FLORIDA, GLOBAL ETS on Dec. 16 for "Systems and methods for testing integrated circuits independent of chip package configuration" (Florida Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,416, issued on Dec. 16, was assigned to UNIVERSITY OF SOUTH FLORIDA (Tampa, Fla.) and GLOBAL ETS LLC (Odessa, Fla.).

"Systems and methods for testing integrated circuits independent of chip package configuration" was invented by Stephen Saddow (Tampa, Fla.), Cong Xu (Odessa, Fla.), Feng Yu (Odessa, Fla.), Liwei Xu (Odessa, Fla.) and Yunghsiao Chung (Odessa, Fla.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods of testing integrated circuits independent of chip package configuration include or utilize a socket configured to receive a device under test (DUT), wherein the socket includes a plurality of input pins and a plurality of ou...