ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,797, issued on May 27, was assigned to UNIVERSITY OF FLORIDA RESEARCH FOUNDATION INC. (Gainesville, Fla.).
"Systems and methods for detecting sources of particle emissions" was invented by Per Andreas Jon Enqvist (Gainesville, Fla.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for detecting radiological sources with improved accuracy. The system comprises at least a first radiological sensor, at least a first three-dimensional (3-D) sensor and processing logic. The first radiological sensor detects radiation emitted by a radiological source and outputs a radiation count rate. The 3-D sensor detects distance of a moving carrier o...