US Patent Issued to UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA on July 8 for "System and method for calibrating weighting errors in split capacitance successive approximation analog-to-digital converters" (Chinese Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,355,461, issued on July 8, was assigned to UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA (Chengdu, China).

"System and method for calibrating weighting errors in split capacitance successive approximation analog-to-digital converters" was invented by Hua Fan (Chengdu, China), Yilin Liu (Chengdu, China), Wei Zhang (Chengdu, China), Jing Luo (Chengdu, China), Panfeng Zhao (Chengdu, China) and Quanyuan Feng (Chengdu, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to the field of microelectronics and solid-state electronics, and in particular to a calibration system and method for weighting errors brought about...