US Patent Issued to UNIVERSITEIT ANTWERPEN, IMEC VZW on Dec. 16 for "Reconstruction method for atom probe tomography" (Belgian Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,500,062, issued on Dec. 16, was assigned to UNIVERSITEIT ANTWERPEN (Antwerp, Belgium) and IMEC VZW (Leuven, Belgium).

"Reconstruction method for atom probe tomography" was invented by Jan Sijbers (Duffel, Belgium), Jan De Beenhouwer (Geraardsbergen, Belgium), Yu-Ting Ling (Antwerp, Belgium) and Wilfried Vandervorst (Leuven, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for determining a three-dimensional atomic distribution of a sample having a tip, during an atom probe tomography process. The method accounts for the tip not being axial symmetric and not having a hemispherical shaped apex throughout the evaporation process."

The paten...