ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,157, issued on Oct. 28, was assigned to UNIVERSITAT STUTTGART (Stuttgart, Germany).
"Single frame-tilted wave interferometer" was invented by Christof PruB (Ostfildern, Germany) and Christian Schober (Ilsfeld, Germany).
According to the abstract* released by the U.S. Patent & Trademark Office: "An interferometer for the measurement of a surface or an optical thickness of an optically smooth test object is provided, wherein the interferometer is configured to illuminate the optically smooth test object simultaneously with a plurality of object waves, which have different wavelengths from one another, and to superimpose the object waves deformed by the illuminated test object onto ...