US Patent Issued to UNIVERSITAET BAYREUTH on Jan. 28 for "Method and device for analog in situ laser process monitoring" (German Inventor)

ALEXANDRIA, Va., Jan. 29 -- United States Patent no. 12,209,860, issued on Jan. 28, was assigned to UNIVERSITAET BAYREUTH (Germany).

"Method and device for analog in situ laser process monitoring" was invented by Georg Herink (Bayreuth, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed is a method and a device for in situ process monitoring and control down to a single pulse measurement during laser processing, like ablation, laser printing additive manufacturing and modification of refractive index. The disclosure relates to laser material processing and to an integrated process monitoring using interference effects of a laser beam or laser pulse."

The patent was filed on Nov. 5, 2019, under...