ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,474,369, issued on Nov. 18, was assigned to UNIVERSIDADE DE AVEIRO (Aveiro, Portugal).
"Hybrid near-field scanning microwave microscope" was invented by Alexander Tselev (Aveiro, Portugal), Nikolai Vyshatko (Aveiro, Portugal) and Luis Manuel Santos Da Rocha Cupido (Aveiro, Portugal).
According to the abstract* released by the U.S. Patent & Trademark Office: "The invention describes a scanning probe imaging system with the probe held at a small distance from a sample (7) surface of the part during raster-scanning image acquisition. The interaction between the sample (7) and the probe's cantilever arm (17') is achieved due to microwave near fields formed at the sharp probe tip (18). Du...