ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,455,262, issued on Oct. 28, was assigned to Universidad Politecnica de Valencia (Valencia, Spain) and ADVANCED WAVE SENSORS S.L. (Paterna, Spain).

"Method and device for characterising the response of resonant sensors" was invented by Roman Fernandez Diaz (Picanya, Spain), Maria Calero Alcarria (Castellon de la Plana, Spain), Jose Vicente Garcia Narbon (Burjassot, Spain), Yolanda Jimenez Jimenez (Valencia, Spain) and Antonio Arnau Vives (Valencia, Spain).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and device for characterizing the response of resonant sensors. The method is based on an analytic algorithm that establishes a relationship betwee...