ALEXANDRIA, Va., June 16 -- United States Patent no. 12,310,249, issued on May 20, was assigned to UNITED MICROELECTRONICS CORP. (Hsin-Chu, Taiwan).
"Semiconductor device and method for fabricating the same" was invented by Hui-Lin Wang (Taipei, Taiwan), Po-Kai Hsu (Tainan, Taiwan), Hung-Yueh Chen (Hsinchu, Taiwan) and Yu-Ping Wang (Hsinchu, Taiwan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor device includes a magnetic tunneling junction (MTJ) on a substrate, a cap layer adjacent to and directly contacting the MTJ, a first inter-metal dielectric (IMD) layer around the MTJ, a top electrode on the MTJ, a metal interconnection under the MTJ, and a second IMD layer around the metal interconnect...