ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,670, issued on Nov. 11, was assigned to United Kingdom Research and Innovation (Swindon, Great Britain).
"Electron microscopy support" was invented by Christopher J. Russo (Cambridge, Great Britain) and Katerina Naydenova (Cambridge, Great Britain).
According to the abstract* released by the U.S. Patent & Trademark Office: "A support for an electron microscopy sample, the support comprising a metallic foil having one or more holes therethrough wherein thickness of the metallic foil is less than 50 nm and/or the mean linear intercept grain size is 50 nm or less, wherein the ratio of the diameter of each hole to the thickness of the metallic foil is 15:1 or less, and wherein the me...