US Patent Issued to UIF (University Industry Foundation), Yonsei University on Sept. 2 for "Scan chain security circuit and driving method thereof" (South Korean Inventors)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,303, issued on Sept. 2, was assigned to UIF (University Industry Foundation), Yonsei University (Seoul, South Korea).

"Scan chain security circuit and driving method thereof" was invented by Sungho Kang (Seoul, South Korea) and Seokjun Jang (Paju-si, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scan chain security circuit includes a scan chain including at least one flip-flop, a scan path obfuscator to obfuscate a path of a pattern sequence input to at least one first flip-flop grouped at an input side of the scan chain, in response to a first control signal, a scan path normalizer to normalize the path of the pattern sequence input ...